JEOL JSM-6490LV variable-pressure SEM
- Flexible: built-in high- and low-vacuum modes
- Effective surface characterization of samples ranging from fresh biological materials to polymers, coatings, and nanomaterials
- Minimal processing artifacts and sample alteration--reduced need for conductive coating
The instrument was installed in spring/summer 2007 through support of the NSF Major Research Instrumentation program, proposal number 0619098.