JEOL JSM-6490LV variable-pressure SEM

 

  • Flexible:  built-in high- and low-vacuum modes
  • Effective surface characterization of samples ranging from fresh biological materials to polymers, coatings, and nanomaterials
  • Minimal processing artifacts and sample alteration--reduced need for conductive coating

The instrument was installed in spring/summer 2007 through support of the NSF Major Research Instrumentation program, proposal number 0619098.

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