JEOL JSM-6490LV variable-pressure SEM
![JEOL JSM-6490LV variable pressure scanning electron microscope](/fileadmin/_processed_/f/2/csm_JEOL_JSM-6490LV_w_desk_cropped_06_db184c8d38.png)
- Flexible: built-in high- and low-vacuum modes
- Effective surface characterization of samples ranging from fresh biological materials to polymers, coatings, and nanomaterials
- Minimal processing artifacts and sample alteration--reduced need for conductive coating
The instrument was installed in spring/summer 2007 through support of the NSF Major Research Instrumentation program, proposal number 0619098.