The Deben MICROTEST tensile stage with 200N load cell is designed for use within the chamber of the JEOL JSM-6490LV scanning electron microscope, where it permits live SEM observation/recording of visible changes in tested materials through failure.

Acquisition software controls the module and provides real-time display of the stress-strain curve.

The tensile stage also can be used with the optical microscope or as a data-logging test module, with no image display.  Saved data is easily transferred to a spreadsheet.